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Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

by Krishnendu Chakrabarty

259 pages · English

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EssaysTechnology

Catalogue length: 259 pages. Length can vary by edition.

Catalogue: Open Library OL17390418W; genres from Open Library subjects; summary generated from catalogue fields · Cover: Open Library Covers (display via covers.openlibrary.org; publisher artwork)